| Field Emission Microscope |
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Information AboutField Emission Microscope |
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FEM consists of a shap needle emitter and a detector, such as a fluorecent screen. A negative electric field is applied to the emitter, emitting electrons from the surface. An image is formed at the detector due to the different current densities, which originates from the difference in electric fields and work functions on the emitter surface by the Fowler-Nordheim Equation . See also: : Atom Probe : Electron Microscope : Field Ion Microscope : List Of Surface Analysis Methods |
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