List Of Surface Analysis Methods

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List Of Surface Analysis Methods

SHOPPER'S DELIGHT

LIBS - Laser Induced Breakdown Spectroscopy

EBSD - Electron Backscatter Diffraction

XRF - X-ray Fluorescence analysis

LOES - Laser optical emission spectroscopy

LS - Light (Raman) Scattering

IRS - Infra Red spectroscopy

SEIRA -Surface enhanced infrared absorption spectroscopy

FTIR - Fourier transform infrared absorption spectroscopy; e.g., ATR (Attenuated Total Reflection), GI (Gracing Incidence), DRIFTS (Diffuse Reflectance)

ESCA - Electron Spectroscopy For Chemical Analysis ; see XPS

XPS - X-ray Photoelectron Spectroscopy

PED - Photoelectron diffraction (also called XPD, PhD, ARPEFS)

AED - Auger electron diffraction

UPS - UV-photoelectron spectroscopy

XAES - X-ray induced Auger electron spectroscopy

EMP - Electron microprobe analysis

AES - Auger Electron Spectroscopy

IIX - Ion induced X-ray analysis

PIXE - Particle (or Proton) Induced X-ray Spectroscopy

REM - Reflection electron microscopy

SE - Spetroscopic Ellipsometry

GDOS - Glow discharge optical spectroscopy

INS - Ion neutralization spectroscopy

PD - Photodesorption

ESD - Electron stimulated desorption

EID - Electron induced desorption

APS - Appearance potential spectroscopy

CL - Cathodoluminescence

LEED - Low energy electron diffraction

RHEED - Reflection High Energy Electron Diffraction

HAS - Helium atom scattering

SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation

SEM - Scanning Electron Microscopy

IAES - Ion induced Auger electron spectroscopy

SIMS - Secondary Ion Mass Spectrometry

GDMS - Glow discharge mass spectrometry

SNMS - Sputtered neutral species mass spectroscopy

ISS - Ion scattering spectroscopy

RBS - Rutherford back-scattering spectroscopy

FEM - Field Emission Microscopy

FIM-AP - Field Ion Microscopy - Atom Probe

NEXAFS - Near Edge X-ray Absorption Fine Structure

SEXAFS - Surface extended X-ray absorption fine structure

XPEEM - X-ray photoelectron emission microscopy

LEEM - Low energy electron microscopy

DVS - Dynamic vapour sorption

IGA - Intelligent gravimetric analysis

SPM - Scanning Probe Microscopy

HREELS - High Resolution Electron Energy Loss Spectroscopy

SNOM - Scanning Near-Field Optical Microscopy

XR - X-ray Reflectivity

X-CTR - X-ray Crystal Truncation Rod scattering

XDS - X-ray Diffuse Scattering

GIXD - Grazing Incidence X-ray Diffraction

SAXS - Small Angle X-ray Scattering

WAXS - Wide Angle X-ray Scattering

GISAXS - Grazing Incidence Small Angle X-ray Scattering

PDEIS - Potentiodynamic electrochemical impedance spectroscopy