List Of Surface Analysis Methods
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List Of Surface Analysis Methods
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LIBS -
Laser Induced Breakdown Spectroscopy
EBSD -
Electron Backscatter Diffraction
XRF -
X-ray Fluorescence
analysis
LOES - Laser optical emission spectroscopy
LS -
Light (Raman) Scattering
IRS - Infra Red spectroscopy
SEIRA -Surface enhanced infrared absorption spectroscopy
FTIR - Fourier transform infrared absorption spectroscopy; e.g., ATR (Attenuated Total Reflection), GI (Gracing Incidence), DRIFTS (Diffuse Reflectance)
ESCA -
Electron Spectroscopy For Chemical Analysis
; see XPS
XPS -
X-ray Photoelectron Spectroscopy
PED - Photoelectron diffraction (also called XPD, PhD, ARPEFS)
AED - Auger electron diffraction
UPS - UV-photoelectron spectroscopy
XAES - X-ray induced Auger electron spectroscopy
EMP - Electron microprobe analysis
AES -
Auger Electron Spectroscopy
IIX - Ion induced X-ray analysis
PIXE -
Particle (or Proton) Induced X-ray Spectroscopy
REM - Reflection electron microscopy
SE -
Spetroscopic Ellipsometry
GDOS - Glow discharge optical spectroscopy
INS - Ion neutralization spectroscopy
PD - Photodesorption
ESD - Electron stimulated desorption
EID - Electron induced desorption
APS - Appearance potential spectroscopy
CL - Cathodoluminescence
LEED - Low energy electron diffraction
RHEED -
Reflection High Energy Electron Diffraction
HAS - Helium atom scattering
SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
SEM -
Scanning Electron Microscopy
IAES - Ion induced Auger electron spectroscopy
SIMS -
Secondary Ion Mass Spectrometry
GDMS - Glow discharge mass spectrometry
SNMS - Sputtered neutral species mass spectroscopy
ISS - Ion scattering spectroscopy
RBS - Rutherford back-scattering spectroscopy
FEM -
Field Emission Microscopy
FIM-AP -
Field Ion Microscopy
-
Atom Probe
NEXAFS -
Near Edge X-ray Absorption Fine Structure
SEXAFS - Surface extended X-ray absorption fine structure
XPEEM - X-ray photoelectron emission microscopy
LEEM - Low energy electron microscopy
DVS - Dynamic vapour sorption
IGA - Intelligent gravimetric analysis
SPM -
Scanning Probe Microscopy
HREELS -
High Resolution Electron Energy Loss Spectroscopy
SNOM - Scanning Near-Field Optical Microscopy
XR -
X-ray Reflectivity
X-CTR -
X-ray Crystal Truncation Rod
scattering
XDS -
X-ray Diffuse Scattering
GIXD -
Grazing Incidence X-ray Diffraction
SAXS -
Small Angle X-ray Scattering
WAXS -
Wide Angle X-ray Scattering
GISAXS -
Grazing Incidence Small Angle X-ray Scattering
PDEIS - Potentiodynamic electrochemical impedance spectroscopy
